PUTERI, RACHMAWATI (2020) ANALISA PERBAIKAN KUALITAS PRODUK KAPASITOR TANTALUM SIZE D2E DENGAN METODE QUALITY CONTROL CIRCLE (QCC) DI PT XYZ. S1 thesis, Universitas Mercu Buana Bekasi.
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Abstract
ABSTRAK PT. XYZ adalah perusahaan yang bergerak dibidang elektronik khususnya memproduksi kapasitor Tantalum yang digunakan pada perangkat elektronik seperti handphone, charger handphone, camera dan laptop. Salah satu jenis kapasitor Tantalum yang banyak diproduksi adalah kapasitor Tantalum size D2E. Seperti kita ketahui sekarang ini perkembangan dunia elektronik semakin pesat, oleh karena itu untuk memenuhi kebutuhan konsumen, perusahaan dituntut untuk menjaga kualitas dari produk kapasitor Tantalum yang dihasilkan. Masalah yang dihadapi PT XYZ adalah tingginya total defect kapasitor Tantalum size D2E yang melebihi standar perusahaan sebesar 0,65% dimana defect penyumbang terbesar adalah defect element bawah. Tujuan penelitian ini adalah untuk menurunkan defect total kapasitor Tantalum size D2E dan defect element bawah serta melakukan perbaikan untuk mencegah kejadian berulang dengan menggunakan metode Quality Control Circle (QCC) dengan bantuan quality tools. Dari pengolahan data dan analisa ditemukan beberapa faktor penyebab yaitu Man, Machine, dan Method. Dari hasil perbaikan pada kegiatan QCC, rata-rata defect total kapasitor Tantalum size D2E turun dari 0,94% menjadi 0,58% dan rata-rata defect element bawah turun dari 0,35% menjadi 0,18%. Kata Kunci: kapasitor tantalum, defect element bawah, quality control circle. ABSTRACT PT. XYZ is an electronics company electronics specifically producing Tantalum capacitors used in electronic devices such as mobile phones, cell phone chargers, cameras and laptops. One type of Tantalum capacitor most produced is D2E size Tantalum capacitors. As we know now the development of the electronics world is growing rapidly, therefore to meet the needs of consumers, companies are required to maintain the quality of the Tantalum capacitor products produced. The problem faced by PT XYZ is the high total defect of Tantalum size D2E capacitors which exceeds the company standard of 0.65% where the biggest contributor to defects is the lower defect element. The purpose of this study is to reduce the total defect of the Tantalum capacitor D2E size and lower defect element and make improvements to prevent recurring events using the Quality Control Circle (QCC) method with quality tools. From data processing and analysis found several factors, namely Man, Machine, and Method. From the results of improvements in QCC activities, the average total defect of Tantalum size D2E capacitors decreased from 0.94% to 0.58% and the average of lower defect element decreased from 0.35% to 0.18% Keywords: tantalum capacitor, lower defect element, quality control circle.
| Item Type: | Thesis (S1) |
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| Call Number CD: | FT/IND 20 017 |
| NIM/NIDN Creators: | 41617320067 |
| Uncontrolled Keywords: | Kata Kunci: kapasitor tantalum, defect element bawah, quality control circle. |
| Subjects: | 600 Technology/Teknologi > 620 Engineering and Applied Operations/Ilmu Teknik dan operasi Terapan > 628 Sanitary Engineering and Environmental Protection Engineering/Rekayasa Sanitasi dan Teknik Perlindungan Lingkungan, Teknik Lingkungan > 628.5 Pollution Control and Industrial Sanitation Engineering/Pengawasan Polusi dan Teknik Sanitasi Industri |
| Divisions: | Fakultas Teknik > Teknik Industri |
| Depositing User: | siti maisyaroh |
| Date Deposited: | 08 Mar 2022 05:00 |
| Last Modified: | 08 Mar 2022 05:00 |
| URI: | http://repository.mercubuana.ac.id/id/eprint/57445 |
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