PENGENDALIAN KUALITAS UNTUK MENGURANGI CACAT PRODUKSI WAFER STICK MENGGUNAKAN PETA KONTROL P

NAZARUDIN, YUSRI CHANIF (2017) PENGENDALIAN KUALITAS UNTUK MENGURANGI CACAT PRODUKSI WAFER STICK MENGGUNAKAN PETA KONTROL P. S1 thesis, Universitas Mercu Buana Jakarta.

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Abstract

PENGENDALIAN KUALITAS UNTUK MENGURANGI CACAT PRODUKSI WAFER STICK MENGGUNAKAN PETA KONTROL P

Item Type: Thesis (S1)
Call Number CD: KP/IND. 17 070
NIM/NIDN Creators: 41613110054
Uncontrolled Keywords: PENGENDALIAN KUALITAS, CACAT PRODUKSI, WAFER STICK, PETA KONTROL P
Subjects: 600 Technology/Teknologi > 650 Management, Public Relations, Business and Auxiliary Service/Manajemen, Hubungan Masyarakat, Bisnis dan Ilmu yang Berkaitan > 658 General Management/Manajemen Umum > 658.6 Quality Management/Manajemen Kualitas
700 Arts/Seni, Seni Rupa, Kesenian > 750 Painting and Paintings/Seni Lukis dan Lukisan > 758 Other Subjects/Subjel Lainnya > 758.6 Industrial and Technical Subjects/Subjek Industri dan Teknik
Divisions: Fakultas Teknik > Teknik Industri
Depositing User: Admin Perpus UMB
Date Deposited: 30 Jan 2017 13:51
Last Modified: 16 Jul 2024 07:30
URI: http://repository.mercubuana.ac.id/id/eprint/32331

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